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N-CHANNEL 50A - 600V TO-247 VERY FAST POWERMESH IGBT

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STGW40NC60V
N-CHANNEL 50A - 600V - TO-247 Very Fast PowerMESHTM IGBT
Table 1: General Features
TYPE STGW40NC60V
s s

Figure 1: Package
IC @100C 50 A

VCES 600 V

VCE(sat) (Max) @25C < 2.5 V

s

s s s

HIGH CURRENT CAPABILITY HIGH FREQUENCY OPERATION UP TO 50 KHz LOSSES INCLUDE DIODE RECOVERY ENERGY OFF LOSSES INCLUDE TAIL CURRENT LOW ER CRES / CIES RATIO NEW GENERATION PRODUCTS WITH TIGHTER PARAMETER DISTRUBUTION

3 2 1

TO- 2 4 7 Weight: 4.41gr 0.01 Max Clip Pressure: 150 N/mm 2 Figure 2: Internal Schematic Diagram

DESCRIPTION Using the latest high voltage technology based on a patented strip layout, STMicroelectronics has designed an advanced family of IGBTs, the PowerMESHTM IGBTs, with outstanding performances. The suffix "V" identifies a family optimized for high frequency.

APPLICATIONS HIGH FREQUENCY INVERTERS s SM PS and PFC IN BOTH HARD SWITCH AND RESONANT TOPOLOGIES s UP S s MO TO R DRIVERS
s

Table 2: Order Codes
SALES TYPE STGW40NC60V MARKING GW40NC60V PACKAGE TO-247 PACKAGING TUBE

Rev. 10 July 2004 1/10

STGW40NC60V
Table 3: Absolute Maximum ratings
Symbol VCES V E CR VGE IC IC ICM (1) PTOT Tstg Tj Parameter Collector-Emitter Voltage (VGS = 0) Reverse Battery Protection Gate-Emitter Voltage Collector Current (continuous) at 25C (#) Collector Current (continuous) at 100C (#) Collector Current (pulsed) Total Dissipation at TC = 25C Derating Factor Storage Temperature Operating Junction Temperature Value 600 20 20 80 50 200 260 2.08 55 to 150 Symbol V V V A A A W W/C C

(1)Pulse width limited by max. junction temperature.

Table 4: Thermal Data
Min. Rthj-case Rthj-amb TL Thermal Resistance Junction-case Thermal Resistance Junction-ambient Maximum Lead Temperature for Soldering Purpose (1.6 mm from case, for 10 sec.) 300 Typ. Max. 0.48 50 Unit C/W C/W C

ELECTRICAL CHARACTERISTICS (TCASE =25C UNLESS OTHERWISE SPECIFIED) Table 5: Off
Symbol VBR(CES) ICES Parameter Collectro-Emitter Breakdown Voltage Collector-Emitter Leakage Current (VCE = 0) Gate-Emitter Leakage Current (VCE = 0) Test Conditions IC = 1 mA, VGE = 0 VGE = Max Rating Tc=25C Tc=125C VGE = 20 V , VCE = 0 Min. 600 Typ. Max. Unit V

10 1 100

A mA nA

IGES

Table 6: On
Symbol VGE(th) VCE(SAT) Parameter Gate Threshold Voltage Collector-Emitter Saturation Voltage Test Conditions VCE= VGE, IC= 250 A VGE= 15 V, IC= 40A, Tj= 25C VGE= 15 V, IC= 40A, Tj= 125C Min. 3.75 1.9 1.7 Typ. Max. 5.75 2.5 Unit V V V

(#) Calculated according to the iterative formula: T T JMAX C I ( T ) = ------------------------------------------------------------------------------------------------CC R ×V (T , I ) THJ C C E SA T (M A X) C C

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ST GW40N C 60V
ELECTRICAL CHARACTERISTICS (CONTINUED) Table 7: Dynamic
Symbol gfs(1) Cies Coes Cres Qg Qge Qgc ICL Parameter Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Total Gate Charge Gate-Emitter Charge Gate-Collector Charge Turn-Off SOA Minimum Current Test Conditions VCE = 15 V, IC= 20 A VCE = 25V, f = 1 MHz, VGE = 0 Min. Typ. 20 4550 350 105 214 30 96 200 Max. Unit S pF pF pF nC nC nC A

VCE = 390 V, IC = 40 A, VGE = 15V, (see Figure 20) Vclamp = 480 V , Tj = 150C RG = 100 , VGE= 15V Test Conditions VCC = 390 V, IC = 40 A RG= 3.3, VGE= 15V, Tj= 25C (see Figure 18) VCC = 390 V, IC = 40 A RG= 3.3, VGE= 15V, Tj= 125C (see Figure 18)

Table 8: Switching On
Symbol td(on) tr (di/dt)on Eon (2) td(on) tr (di/dt)on Eon (2) Parameter Turn-on Delay Time Current Rise Time Turn-on Current Slope Turn-on Switching Losses Turn-on Delay Time Current Rise Time Turn-on Current Slope Turn-on Switching Losses Min. Typ. 43 17 2060 330 42 19 1900 640 Max. Unit ns ns A/s J ns ns A/s J

450

2) Eon is the turn-on losses when a typical diode is used in the test circuit in figure 2. If the IGBT is offered in a package with a co-pack diode, the co-pack diode is used as external diode. IGBTs & DIODE are at the same temperature (25C and 125C)

Table 9: Switching Off
Symbol tr(Voff) td(off) tf Eoff (3) Ets tr(Voff) td(off) tf Eoff (3) Ets Parameter Off Voltage Rise Time Turn-off Delay Time Current Fall Time Turn-off Switching Loss Total Switching Loss Off Voltage Rise Time Turn-off Delay Time Current Fall Time Turn-off Switching Loss Total Switching Loss Vcc = 390 V, IC = 40 A, RGE = 3.3 , VGE = 15 V Tj = 125 C (see Figure 18) Test Conditions Vcc = 390 V, IC = 40 A, RGE = 3.3 , VGE = 15 V TJ = 25 C (see Figure 18) Min. Typ. 25 140 45 720 1050 60 170 77 1400 2040 970 1420 Max. Unit ns ns ns

J J
ns ns ns

J J

(3)Turn-off losses include also the tail of the collector current.

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STGW40NC60V
Figure 3: Output Characteristics Figure 6: Transfer Characteristics

Figure 4: Transconductance

Figure 7: Collector-Emitter On Voltage vs Temp e rat u re

Figure 5: Collector-Emitter On Voltage vs Collector Current

Figure 8: Normalized Gate Threshold vs Temp e rat u re

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Figure 9: Normalized Breakdown Voltage vs Temperature Figure 12: Gate Charge vs Gate-Emitter Voltage

Figure 10: Capacitance Variations

Figure 13: Total Switching Losses vs Temperature

Figure 11: Total Switching Losses vs Gate Resistance

Figure 14: Total Switching Losses vs Collector C u rren t

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Figure 15: Thermal Impedance Figure 17: Ic vs Frequency

Figure 16: Turn-Off SOA

For a fast IGBT suitable for high frequency applications, the typical collector current vs. maximum operating frequency curve is reported. That frequency is defined as follows: fMAX = (PD - PC) / (EON + EOFF) 1) The maximum power dissipation is limited by maximum junction to case thermal resistance: PD = T / RTHJ-C considering T = TJ - TC = 125 C- 75 C = 50C 2) The conduction losses are: PC = IC * VCE(SAT) * with 50% of duty cycle, VCESAT typical value @ 125 C . 3) Power dissipation during ON & OFF commutations is due to the switching frequency: PSW = (EON + EOFF) * freq. 4) Typical values @ 125C for switching losses are used (test conditions: VCE = 390V, VGE = 15V, RG = 3.3 Ohm). Furthermore, diode recovery energy is included in the EON (see note 2), while the tail of the collector current is included in the EOFF measurements (see note 3).

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Figure 18: Test Circuit for Inductive Load Switching Figure 20: Gate Charge Test Circuit

Figure 19: Switching Waveforms

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TO-247 MECHANICAL DATA
mm. MIN. 4.85 2.20 1.0 2.0 3.0 0.40 19.85 15.45 5.45 14.20 3.70 18.50 3.55 4.50 5.50 3.65 5.50 0.140 0.177 0.216 14.80 4.30 0.560 0.14 0.728 0.143 0.216 TYP MAX. 5.15 2.60 1.40 2.40 3.40 0.80 20.15 15.75 MIN. 0.19 0.086 0.039 0.079 0.118 0.015 0.781 0.608 0.214 0.582 0.17 inch TYP. MAX. 0.20 0.102 0.055 0.094 0.134 0.03 0.793 0.620

DIM. A A1 b b1 b2 c D E e L L1 L2 øP øR S

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Table 10: Revision History
Date 13-Jul-2004 14-Jul-2004 Revision 9 10 Description of Changes Stylesheet update. No content change Some datas have been updated

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STGW40NC60V

Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a registered trademark of STMicroelectronics All other names are the property of their respective owners 2004 STMicroelectronics - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States.

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Document Number: 9303

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